EMProbe-DBM-E6 — 6-Axis Robotic Near-Field EMI Diagnostics on the Bench

Accurate, repeatable EMI source localization using a single probe and a 6-axis robotic arm

Handheld near-field probing is a proven method for diagnosing EMC/EMI issues, but it is inherently operator-dependent and difficult to reproduce—especially on dense boards, assemblies with height variation, or complete products. The EMProbe-DBM-E6 solves this by combining a computer-controlled 6-axis robotic arm with near-field probes and EMViewer software to deliver high-precision, repeatable scanning with 0.01 mm repeatability.

This platform is ideal for pre- and post-compliance diagnostics, including scanning of non-flat surfaces and complete products, where traditional planar scanning methods are limited. System performance is primarily determined by the selected spectrum analyzer and probe, enabling a scalable solution aligned to your measurement needs. 

Key Technical Advantages

• Robotic repeatability (0.01 mm) to remove operator variability and improve correlation between design iterations 
• 6-axis motion enables scanning over 3D geometries, tall components, and non-flat DUT surfaces 
• Probe-agnostic workflow supports off-the-shelf handheld probes and Y.I.C. probes 
• Spectrum analyzer flexibility: analyzers supporting SCPI can be controlled from EMViewer 
• Fast debug cycle: diagnose, modify, and retest quickly—supports intermittent issues and verification of fixes 
• Broad application coverage: emissions, immunity, filtering, shielding, broadband noise, and common-mode checks 

Typical Applications

• Component-side scanning of dense PCBs (high-speed / high-power / high-density) 
• EMProbe-DBM-E6-Datasheet
• 3D near-field scanning of assemblies and complete products
• Root-cause localization for radiated emissions and coupling paths
• Cable/common-mode noise investigations (with suitable probes)
• EMI shielding effectiveness checks (relative comparisons)
• Design iteration comparisons and documented debug workflows